| 1. | Generic specification of four - point probe
四探针探头通用技术条件 |
| 2. | Four - point probe - test equipment used to test resistivity of wafers
四探针-测量半导体晶的阻电面表片设备。 |
| 3. | Four - point probe - test equipment used to test resistivity of wafers
四探针-测量半导体晶片表面电阻的设备。 |
| 4. | Generic specification of resistivity measuring instrument with four - point probe
直流四探针电阻率测试仪通用技术条件 |
| 5. | Testing method for resistivity of conductive plastics with a four - point probe array
用四点探针排列法测定传导塑料电阻率的测试方法 |
| 6. | Gold pointed probe
金尖探子 |
| 7. | Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
用四点探针法对硅晶体和硅片电阻率的测试方法 |
| 8. | Test method for resistivity of conductive fine ceramic thin films with a four - point probe array
用四点探针排列法测定传导精细陶瓷薄膜电阻率的试验方法 |
| 9. | Standard practice for measuring sheet resistance of thin film conductors for flat panel display manufacturing using a four - point probe
使用四点探测法测定专业平板显示器用薄膜导线的薄膜电阻的标准规程 |
| 10. | This is the first time in this field . 2 . putting forward rymaszewski method to square four point probe measurement
利用rymaszewski法自动消除探针纵向游移影响的优点，将它应用于方形探针测试法中3 |
